Phaseye S Ultrasonic Phased Array Flaw Detector

The Phaseye S is a compact, lightweight phased array system that delivers powerful performance in a portable design. Featuring a large, easy-to-view display, it supports A-scan, sectorial, and linear scanning modes, as well as single-beam and fused C-scan and D-scan displays. The Phaseye S also includes TOFD capabilities and can simultaneously display TOFD and phased array images for comprehensive inspection analysis.

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Product Information

The Latest Generation of High-Performance Ultrasonic Phased Array Flaw Detector

Compact and lightweight, the Phaseye S delivers exceptional portability without sacrificing display size or clarity. Its robust hardware enables advanced phased array performance, supporting A-scan, sectorial, and linear scanning modes. The system also provides single-beam and fused C-scan/D-scan displays, as well as TOFD capabilities with simultaneous TOFD and phased array imaging.

With 32 independent channels and support for probes of up to 64 elements, the Phaseye S adapts easily to a wide range of inspection needs. Its versatility and field-ready design make it an ideal solution for industries that require powerful, on-the-go nondestructive testing.

Available Models:

PHASEYE PA16-64PR-S, TOFD

PHASEYE PA16-128PR-S, TOFD

Instrument Highlights:

    • Supports a maximum amplitude of 800%, maintaining signal integrity without overflow, even in highly sensitive detection scenarios.
    • Features advanced ACG/TCG functionality, including manual TCG, independent and simultaneous ACG/TCG recording.
    • Equipped with self-diagnosis capabilities for real-time testing of both probe and instrument status.
    • Boasts a powerful interface wave tracking function, with TCG position dynamically adjusting in real time based on the interface wave.
    • Enables remote operation control through a wireless remote controller, providing flexibility in field environments.
    • Offers a flexible custom view layout, allowing customization of the best view mode according to specific inspection application requirements.