dynamic 41 digital detectors
The dynamic 41|100 and 200 detectors are the first in GE’s next generation industrial X-ray flat panel detector platform. The 41|100 detector combines superior image quality with improved detection speed at 410 x 410 mm² detection area and 100 μm pixel size. It achieves 100 micron results at 200 micron efficiency and contrast-to-noise-ratio, while the new 41|200 detector increases industrial inspection speed by factor 2-3, allowing high throughput fully automated CT on the production floor.
Based on proprietary X-ray detector technology, Inspection Technologies exclusively offers its first 100 µm, 16M pixel detector designed and optimized exclusively for rough and high-energy industrial X-ray applications to its radiography and CT customers. GE’s proprietary EnduranceTM CSI scintillator offers superior resolution and brightness compared to conventional GadOx or other powder based scintillators.
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Benefits
- Large area 16” X-ray detector with 100 µm pixelsize (16 MPixels) for superior image and result quality designed and optimized for longterm reliability at industrial high-energy use.
- High-resolution images for easy detection of subtle indications (up to 50 µm feature detection with minifocus X-ray tubes).
- Next generation photodiode design for up to 10x improved efficiency and sensitivity compared to state of the art 200 µm pixel detectors allows 2x resolution increase without cycle time impact.
Applications
- Detection of 2x smaller defects without increase of geometric magnification allows imaging of large objects at higher resolution.
- Reduce inspection times due to increased detector sensitivity, faster frame rates, larger imaging area and adaptive imaging modes.
Exclusivity
- Inspection Technologies’ proprietary dynamic 41 detector family is exclusively available for its system customers.
- The dynamic 41|100 detector is optionally available for the phoenix v|tome|x c, m and L CT systems and on request also for the Seifert x|cube.
Technical Specifications
